EPF10K30ABI356-3

The EPF10K30ABI356-3 from Altera delivers breakthrough performance in Embedded - FPGAs (Field Programmable Gate Array) for scientific instrumentation and test equipment. This precision FPGA combines ultra-low noise analog capabilities with high-speed digital processing, enabling next-generation measurement systems. The architecture includes specialized blocks for time-to-digital conversion and synchronous sampling.Organized into 216 precision-optimized logic blocks, the architecture supports synchronous sampling across multiple channels. Each block includes dedicated timing calibration resources.Featuring 1728 low-jitter logic elements, this device implements precision timing measurement circuits. The architecture minimizes clock skew across the entire die, critical for time interval analysis applications.With 12288 bits of low-noise memory, the FPGA buffers high-resolution measurement data without introducing artifacts. The memory subsystem implements error logging for statistical analysis of measurement reliability.The 246 precision analog-capable I/Os support direct sensor interfacing with femtoampere resolution. Each I/O bank includes programmable gain amplifiers for optimal signal conditioning.The 69000 equivalent gate count enables implementation of complex digital lock-in amplifiers. The hardened DSP blocks accelerate Fourier analysis for real-time spectrum processing.Operating from 3V ~ 3.6V, the ultra-clean power architecture achieves sub-microvolt noise levels. The isolated power domains prevent digital switching noise from affecting sensitive analog measurements.The Surface Mount package configuration minimizes thermoelectric effects in precision measurement applications. The low-thermal-EMF materials prevent measurement drift due to temperature gradients.Rated for -40°C ~ 85°C (TA) operation, the device maintains metrological accuracy across laboratory conditions. The temperature compensation algorithms correct for minor parameter variations.The 356-LBGA package design minimizes parasitic capacitance for high-impedance measurements. The guarded traces prevent leakage currents from affecting sensitive nodes.Available in 356-BGA (35x35) format, the device meets calibration laboratory requirements. The packaging includes certification documentation for traceable measurements.