ED650/5DS

Designed for precision instrumentation, On Shore Technology Inc.'s ED650/5DS delivers exceptional performance in Terminal Blocks - Wire to Board applications. This laboratory-grade terminal block ensures measurement accuracy through ultra-low contact resistance and superior signal integrity. The 510KBA-BAAG is particularly suited for test equipment, medical devices, and scientific instrumentation requiring reliable low-noise connections.The 1 configuration minimizes parallel capacitance effects in sensitive circuits. Isolated level construction reduces crosstalk to <0.1pF between adjacent channels.With 5 precision contacts, the block accommodates high-channel-count measurements. Each position features beryllium copper contacts with <1m resistance variation.0.276" (7.00mm) spacing eliminates parallel resonance effects up to 1GHz. The precision-molded slots maintain consistent impedance for high-frequency signals.Vertical with Board alignment facilitates ergonomic probe access during testing. The angled options enable clean cable management in rack-mounted systems.The 6 A rating supports both signal and power distribution needs. Gold-over-nickel plating ensures stable contact resistance even at microamp measurement levels.Rated for 250 V isolation, the block prevents leakage currents from affecting sensitive measurements. The PTFE insulation material exhibits <0.001% dielectric absorption.Accepting 16-28 AWG precision wires, the termination preserves conductor integrity. The non-magnetic contact materials prevent thermocouple effects in low-voltage circuits.Through Hole installation ensures stable grounding for noise-sensitive applications. The mounting interface incorporates RFI shielding gaskets for electromagnetic compatibility.The Screw mechanism prevents conductor damage during repeated reconfigurations. The tool-less design maintains consistent clamping force within 5% tolerance.The Gray housing enables quick visual identification of measurement channels. The non-reflective surface finish minimizes optical interference in laser-based systems.