DLP-245PL-G

The DLP-245PL-G from DLP Design Inc. delivers military-grade reliability for the Embedded - Microcontroller, Microprocessor, FPGA Modules sector, specifically developed for aerospace and defense applications. Its radiation-hardened design and secure architecture meet the most demanding requirements for avionics and satellite systems.The MCU, USB Core configuration incorporates triple modular redundancy for fault-tolerant space applications. This architecture provides graceful degradation capabilities essential for long-duration satellite missions.At its core, the PIC16F8722 features SEU-resistant logic and hardened registers. Its deterministic execution pipeline has been qualified for radiation environments up to 50krad, making it suitable for LEO satellite constellations.The radiation-tolerant FT245RL accelerates cryptographic operations while maintaining TEMPEST compliance. This dedicated security processor enables real-time encryption of classified communications in battlefield systems.With a clock speed of 24MHz, the processor balances performance with power efficiency in space-constrained payloads. The radiation-hardened PLL maintains stable clock generation even in high-ionization environments.The 128KB radiation-resistant flash memory includes scrubbing capabilities to mitigate single-event effects. This storage solution has been flight-proven in multiple Mars rover missions and deep-space probes.3.75KB of SECDED-protected RAM ensures data integrity in high-radiation orbits. The memory subsystem's error detection and correction capabilities exceed MIL-STD-883 requirements for space applications.The USB - B, Pin Header interface meets MIL-DTL-38999 specifications for harsh environments. Its hermetic sealing and redundant contact design ensure reliable operation in vibration-intensive fighter jet avionics.The compact 2.8" x 2" (71.1mm x 50.8mm) form factor enables integration into CubeSat payloads. Despite its small size, the package provides adequate shielding against cosmic ray-induced single-event effects.