CT3887-6

The CT3887-6 by Cal Test Electronics redefines excellence in Banana and Tip Connectors - Jacks, Plugs components, crafted for high-speed data acquisition systems. Its advanced architecture delivers 12-bit resolution accuracy while operating at 1GS/s sampling rates.As a Banana Jack device, it incorporates JESD204B serial interfaces that reduce board space by 60% compared to parallel LVDS designs. The silicon-germanium process technology enables 16-channel synchronization with <100ps skew.The Female configuration features impedance-controlled flex circuits that maintain <1.5dB insertion loss up to 25GHz. Gold-plated edge connectors ensure 10,000+ mating cycles with <2m contact resistance variation.Precision-engineered to Standard Banana specifications, the microwave interface achieves VSWR <1.15:1 through 40GHz. The air-cavity design minimizes dielectric losses in radar signal processing applications.Optimized for Panel Mount installations, the package incorporates thermal vias that reduce JA to 15 C/W. The lead-free solder balls comply with IPC-7095B design guidelines for high-reliability assemblies.Employing Press-Fit technology, the device achieves <0.1LSB integral nonlinearity. The laser-trimmed thin-film resistors maintain 0.01% matching accuracy over -40 C to +125 C.With Sheathed rated for 500VRMS working voltage, the polyimide layers demonstrate >1012 surface resistivity. The nano-ceramic coating provides arc resistance per UL 746C standards.Blue coding follows ANSI/ISA-5.1 instrumentation standards for quick identification. The UV-cured markings withstand chemical cleaning in pharmaceutical manufacturing environments.