CT2013-2

Cal Test Electronics's CT2013-2 delivers unparalleled performance in Banana and Tip Connectors - Jacks, Plugs applications, specifically optimized for electric vehicle battery management systems. Its innovative design withstands 3000G mechanical shock while maintaining signal integrity.As a Banana Plug, Stackable connector, it incorporates silver-graphite contacts that reduce mating force by 30% while maintaining 50A current capacity. The rotating collar design prevents cable twisting during high-vibration operation.The Male configuration features hot-swappable design with arc-quenching chambers that safely interrupt 100A loads. The insulated shroud meets IP6K9K dust/water ingress protection standards.Precision-engineered to Standard Banana specifications, the contact surface achieves <10n m resistivity with 50 m gold plating over nickel barrier. The hyperbolic profile ensures zero insertion force misalignment.Designed for Free Hanging (In-Line) installation, the connector backshell provides 360 EMI shielding effectiveness >60dB up to 10GHz. The conductive gasket material complies with ASTM B809 standards.The Solderless method utilizes ultrasonic welding that creates molecular bonds between conductors. This process demonstrates 50% higher fatigue resistance than mechanical crimps in vibration testing.Non-Mating End Insulated materials are rated for 300 C intermittent operation in engine compartment environments. The ceramic-filled PEEK construction maintains dielectric strength >20kV/mm after thermal aging.The Set Screw package includes integrated current sensors with 1% accuracy for smart grid applications. The tamper-proof design meets ANSI C12.20 revenue metering standards.Red options include high-visibility fluorescent coatings for safety applications. The colorfast pigments withstand 3000+ hours of UV exposure per SAE J1885 accelerated testing.Compatible with 12 AWG conductors, the termination system automatically adjusts for wire ovality variations up to 15%. The parallel-grip mechanism prevents conductor deformation during torque application.