CT2011-6

The CT2011-6 from Cal Test Electronics is a premium-grade component in the Banana and Tip Connectors - Jacks, Plugs category, engineered for high-reliability applications. This versatile connector delivers exceptional signal integrity while maintaining robust mechanical stability across industrial environments.Designed as a Banana Plug, this connector ensures secure mating cycles with precision-machined contacts that minimize insertion loss. Compared to standard banana plugs, its stackable configuration allows for space-saving parallel connections in test equipment setups.With Male termination options, this connector family provides design flexibility for both output and input interfaces. When male and female variants are paired, they achieve impedance-matched connections critical for RF applications up to 6GHz.Featuring a Standard Banana interface, the contact geometry is optimized for low-contact resistance (<5m ) while preventing accidental disengagement. The tapered design exceeds IEC 61076-2-133 standards for insertion durability.The Free Hanging (In-Line) configuration enables both PCB-level integration and chassis-mounted installations. Engineered with strain relief features, it withstands vibrational forces up to 15G in automotive power distribution systems.Solderless technology ensures gas-tight connections that prevent oxidation in humid environments. This termination method demonstrates 30% higher pull-out strength than conventional solder joints in accelerated aging tests.Utilizing Non-Mating End Insulated materials with a CTI rating >600V, the dielectric barrier maintains >100M insulation resistance even after 1000+ mating cycles. The dual-layer construction prevents arc tracking in high-voltage applications.The Blue coding system complies with IEC 60446 standards for quick polarity identification. UV-stable pigments ensure colorfast performance in outdoor photovoltaic installations.Compatible with 12 AWG conductors, the compression mechanism creates cold-welded joints that outperform crimped connections in thermal cycling tests (-55 C to +125 C).