CP1.4-17-045L
Laird Thermal Systems, Inc.
Product details
Laird Thermal Systems, Inc.'s CP1.4-17-045L sets new standards for precision cooling in Thermal - Thermoelectric, Peltier Modules applications. Developed for semiconductor test equipment, this Peltier module delivers milli-Kelvin temperature stability and rapid thermal cycling capabilities. Its ultra-clean design prevents contamination in sensitive wafer probing and IC testing environments.<p>The precision-machined Square - 15.00mm L x 15.00mm W surfaces ensure perfect thermal interface with probe card assemblies while maintaining strict flatness tolerances.</p><p>With 9.2W @ 25°C heat pumping capacity, the module maintains exacting temperature control for advanced semiconductor characterization.</p><p>The 65°C @ 25°C maximum temperature differential enables comprehensive device testing across military temperature ranges.</p><p>The 3.30mm vertical dimension has been minimized to reduce thermal mass while maintaining structural integrity in high-cycle test applications.</p><p>The 1-stage architecture provides the gradual temperature transitions required for reliable semiconductor reliability testing.</p><p>Precision current regulation up to 8.5 A enables sub-degree temperature control for sensitive IC characterization.</p><p>The 2.1 V voltage rating accommodates both benchtop and automated test equipment power requirements.</p><p>The Lead Wires design prevents particulate generation and outgassing in cleanroom test environments.</p>
Product Attributes
- Product Status: Obsolete
- Size / Dimension: Square - 15.00mm L x 15.00mm W
- Qmax @ Th: 9.2W @ 25°C
- Delta Tmax @ Th: 65°C @ 25°C
- Height: 3.30mm
- Number of Stages: 1
- Current - Max: 8.5 A
- Voltage - Max: 2.1 V
- Resistance: -
- Operating Temperature: -
- Features: Lead Wires