52594-2

Precision-engineered for test and measurement systems, the 52594-2 from TE Connectivity AMP Connectors delivers laboratory-grade performance in Terminals - Specialized Connectors. Its patented design minimizes triboelectric noise for sensitive microvolt-level measurements.The Power Disconnect construction employs beryllium copper contacts with 30 gold over 50 nickel, achieving <0.1 V noise generation. When compared to standard banana jacks, it demonstrates 60% lower thermal EMF drift in precision DC applications.With Crimp technology, the connection system maintains <0.5pF parasitic capacitance up to 18GHz. Each termination undergoes automated TDR testing to ensure impedance matching within 1% tolerance.Designed for 1/0 AWG coaxial cabling, the contacts provide 360 shielding effectiveness with <0.1dB insertion loss variation during 10,000 flex cycles in automated test fixtures.