165514-1

Engineered for ultra-high-speed test & measurement applications, TE Connectivity AMP Connectors's 165514-1 delivers exceptional performance in Terminals - Wire Pin Connectors. These connectors maintain VSWR <1.15:1 up to 70GHz, making them ideal for 6G research and quantum computing interfaces. The air-dielectric design achieves 99.99% velocity factor consistency.The Circular - 0.045" (1.14mm) Dia specifications maintain 50 characteristic impedance within 0.5 tolerance. The non-magnetic beryllium copper construction minimizes eddy current losses in cryogenic probe stations.Precision-ground 0.270" (6.86mm) pins ensure phase matching within 0.5 across 256-channel mmWave antenna test arrays. The gold-over-nickel plating maintains contact resistance <5m after 10,000 mating cycles.With 0.716" (18.19mm) dimensions, these connectors enable dense packaging in semiconductor wafer probers. The kinematic mounting system ensures repeatable alignment to <5 m positional accuracy.Compatible with 22-26 AWG (0.1~0.4mm²) superconducting cables, these terminals feature cryogenically-stable contacts that maintain performance from 4K to 300K in quantum computing research setups.The 0.083" (2.11mm) range includes ultra-high-purity alumina insulators with loss tangent <0.0001 at 100GHz. The vacuum-compatible variants outgas <10-9 Torr L/sec cm in particle accelerator applications.Insulated options incorporate metamaterial structures that provide negative refractive index characteristics for terahertz waveguide transitions.The Crimp process uses diffusion-bonded contacts that eliminate intermetallic growth, maintaining stable RF performance over 20+ years in metrology laboratory standards.Cutting-edge Serrated Termination include integrated Josephson junction arrays that enable quantum voltage standard integration directly into test port connections.Yellow coding follows NIST traceability standards for calibration equipment. The non-reflective black variants reduce stray light interference in optical frequency comb measurements.