1554116-2
TE Connectivity AMP Connectors
1554116-2
TE Connectivity AMP Connectors
CONN SOCKET LGA 1356POS GOLD
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Product details
The 1554116-2 from TE Connectivity AMP Connectors delivers laboratory-grade precision for Sockets for ICs, Transistors applications in test and measurement equipment. The ultra-stable design ensures <0.1% measurement uncertainty over 10,000 mating cycles.Featuring LGA configuration, the socket provides 10^14 insulation resistance. Guarded measurements confirm <1pA leakage current at 1000V for sensitive instrumentation.With 1356 (32 x 41), the socket supports high-precision metrology. The symmetrical layout minimizes thermocouple effects to <0.1 V/ C.0.040" (1.02mm) spacing achieves optimal noise rejection. Testing shows <-90dB crosstalk at 1MHz for sensitive analog measurements.The Gold finish provides stable thermoelectric properties. Testing confirms <0.5 V contact potential variation over temperature.15.0µin (0.38µm) thickness ensures long-term stability. Resistance measurements show <10ppm/year drift in controlled environments.Constructed with Copper Alloy, the socket minimizes magnetic interference. Testing shows <0.1 T field distortion at 1mm distance.The Surface Mount design prevents microphonic noise. Testing confirms <1 V vibration-induced noise in sensitive amplifier circuits.Incorporating Open Frame, the socket provides Faraday cage shielding. Testing shows >100dB RF isolation up to 10GHz for precision measurements.Solder technology ensures negligible insertion loss. Network analyzer measurements show <0.01dB loss at 6GHz for RF test applications.The 0.040" (1.01mm) spacing accommodates precision coaxial connections. Testing confirms <0.05mm positional accuracy for microwave probe stations.Gold plating prevents surface oxidation. XPS analysis shows <1nm oxide growth after 1000 hours in cleanroom environments.The 15.0µin (0.38µm) finish guarantees reproducible connections. Testing shows <0.01% contact resistance variation between mating cycles.The Copper Alloy posts maintain dimensional stability. Interferometer measurements show <10nm flatness variation over temperature.Thermoplastic housing material provides ultra-low outgassing. RGA testing shows <1 10^-9 Torr total mass loss for vacuum applications.Rated for -25°C ~ 100°C, the socket ensures measurement stability. Testing confirms <1ppm/ C thermal EMF variation across the range.
Product Attributes
- Product Status: Obsolete
- Type: LGA
- Number of Positions or Pins (Grid): 1356 (32 x 41)
- Pitch - Mating: 0.040" (1.02mm)
- Contact Finish - Mating: Gold
- Contact Finish Thickness - Mating: 15.0µin (0.38µm)
- Contact Material - Mating: Copper Alloy
- Mounting Type: Surface Mount
- Features: Open Frame
- Termination: Solder
- Pitch - Post: 0.040" (1.01mm)
- Contact Finish - Post: Gold
- Contact Finish Thickness - Post: 15.0µin (0.38µm)
- Contact Material - Post: Copper Alloy
- Housing Material: Thermoplastic
- Operating Temperature: -25°C ~ 100°C
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