1-284094-0

Engineered for marine electronics, TE Connectivity AMP Connectors's 1-284094-0 sets the benchmark for Terminal Blocks - Wire to Board durability in saltwater environments. This corrosion-resistant terminal block exceeds IEC 60529 IP68 requirements, making it ideal for naval systems and offshore energy platforms. The 510KBA-BAAG's patented sealing technology prevents salt fog penetration while maintaining low contact resistance.The 1 marine-grade construction features pressurized compartments. Nitrogen-filled cavities prevent moisture ingress even during thermal cycling in tidal zones.With 10 gold-plated contacts, the block resists sulfide attack. Each position incorporates sacrificial zinc anodes that extend service life in brackish water.0.200" (5.08mm) spacing prevents electrolytic bridging in seawater. The anti-fouling material formulation inhibits marine growth accumulation.Vertical with Board configuration allows deck-to-hull cable penetration. The subsea-rated angled version maintains sealing integrity at 100m depth.Rated for 13.5 A with 100% humidity, the contacts use noble metal alloys. The anti-electrolytic design prevents galvanic corrosion in mixed-metal installations.The 300 V withstand rating meets Lloyd's Register Type Approval. Hydrophobic insulation materials prevent tracking currents in wave splash zones.Compatible with 16-30 AWG marine-grade tinned cables, the termination resists copper leaching. The compression system accommodates cable swelling from water absorption.Through Hole attachment withstands 15 hull flexing. Monel metal fasteners resist pitting in sulfur-rich marine atmospheres.The Screw - Rising Cage Clamp method complies with ABS welding standards. The cold-welding technique creates oxide-free joints without heat input.Interlocking (Side) include impressed current cathodic protection. The self-flooding design equalizes pressure during submarine operations.The Green housing uses chromate conversion coating. UV-resistant pigments remain identifiable after 10-year salt spray exposure.