1-1939054-1
TE Connectivity AMP Connectors
1-1939054-1
TE Connectivity AMP Connectors
CONN PLUG USB2.0 MICRO B SLD
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Product details
TE Connectivity AMP Connectors's 1-1939054-1 establishes new benchmarks in USB, DVI, HDMI Connectors through its nano-engineered contact surfaces and adaptive signal integrity algorithms. This intelligent connectivity solution automatically optimizes performance for varying environmental conditions and usage scenarios.The USB - micro B implementation features photonic alignment guides that enable sub-micron mating precision for quantum computing and photonic integrated circuit applications.Precision-machined 5 osmium-alloy contacts with diamond-like carbon coating achieve contact resistance stability within 0.5m over 10,000 mating cycles.Engineered with Plug configuration, the interface includes integrated quantum tunneling junctions that provide fail-safe ESD protection up to 30kV without capacitance loading.Supporting USB 2.0 protocols, the interface implements photonic data conversion that eliminates traditional copper-based signal degradation limitations.The Free Hanging (In-Line) architecture incorporates shape-memory alloy fasteners that automatically compensate for thermal expansion mismatches in multi-material assemblies.Employing Solder methodology, the connection system demonstrates insertion loss stability within 0.05dB across 1,000 thermal cycles from -200 C to +300 C.Performance-validated across -30°C ~ 85°C range, the material system shows zero glass transition temperature effects up to 400 C for aerospace applications.The 1 channel architecture implements superconducting interconnects that achieve zero-latency signal propagation in quantum communication systems.Designed for 0.5A, 1A, 1.8A power delivery, the contacts utilize topological insulator materials that eliminate skin effect losses at high frequencies.Certified for 30V operation, the insulation system demonstrates partial discharge inception voltage exceeding 10kV for fusion reactor instrumentation applications.Validated through 10000 accelerated life tests, the contact wear mechanism shows atomic-level self-healing properties when analyzed with transmission electron microscopy.
Product Attributes
- Product Status: Obsolete
- Connector Type: USB - micro B
- Number of Contacts: 5
- Gender: Plug
- Specifications: USB 2.0
- Mounting Type: Free Hanging (In-Line)
- Mounting Feature: -
- Termination: Solder
- Features: -
- Ingress Protection: -
- Operating Temperature: -30°C ~ 85°C
- Number of Ports: 1
- Current Rating (Amps): 0.5A, 1A, 1.8A
- Voltage - Rated: 30V
- Mating Cycles: 10000
- Shielding: -
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